Tran P, Vo D. Effects of transient recovery voltage and degradation solutions when opening shunt reactor at 500 kV O Mon substation. VNUHCM Journal of Engineering and Technology [Internet]. 16Oct.2019 [cited 7Apr.2026];2(2):86-. Available from: https://et.vnuhcmjournal.com.vn/index.php/et/article/view/500